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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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G

Gadjiev, T. M.
Gadjieva, R. M.
Gadzhiev, T. M.
Gadzhieva, N. N.
Gainullin, I. K.
Gainutdinov, R. V.
Gaisina, A. R.
Galashev, A. E.
Galiev, G. B.
Galimzyanov, R. R.
Gamov, N. A.
Ganin, G. V.
Gapon, I. V.
Garakhin, S. A.
Garamus, V. M.
Garanga, S. N.
Garmash, V. I.
Gasenkova, I. V.
Gasparyan, Y. M.
Gasparyan, Yu. M.
Gavrilenko, V. A.
Gavrilov, N. V.
Gavrilov, S. A.
Gavrilyuk, A. G.
Gaysina, A. R.

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