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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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V

Vainer, Yu. A.
Vakhrushev, S. B.
Val’kov, V. V.
Val’yano, G. E.
Valeev, R. G.
Valeev, V. F.
Valeeva, L. R.
Valiev, H. H.
Valiev, Kh. Kh.
Valkov, S.
Valueva, S. V.
Valyukhov, S. G.
Varayun’, M. I.
Vardanyan, E. L.
Varlashov, I. B.
Varnakov, S. N.
Vasil’ev, A. L.
Vasil’eva, V. I.
Vasiliev, A. L.
Vasiliev, V. K.
Vasilov, R. G.
Vasilyev, A. L.
Vasilyev, S. A.
Vasin, A. V.
Vasin, R. N.

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