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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
Home > Search > Browse Author Index

Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

P

Puzynina, T. P.
Pyachin, S. A.
Pyataev, A. V.

R

Rabadanova, D. I.
Rabbimov, E. M.
Rachkovskaya, G. E.
Radu, F.
Rajabi, M.
Rakhimov, A. M.
Rakhimova, T. V.
Rakshun, Ya. V.
Ramonova, A. G.
Rappl, P. H. O.
Ratkevich, G. V.
Rau, E. I.
Rautskii, M. V.
Razdobarin, A. G.
Razgulina, O. V.
Raznitsyn, O. A.
Razov, V. I.
Rekhviashvili, S. Sh.
Remnev, G. E.
Rempel, A. A.
Reshetnikov, A. S.
Reznik, A. N.

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