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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

P

Parfenov, N. M.
Pariev, D. E.
Parkhomenko, L. A.
Parkhomenko, Yu. N.
Parsegova, V. S.
Parshin, E. O.
Parshina, L. S.
Pasechnik, L. A.
Pashchenko, A. S.
Pavelyev, V. S.
Pavlenko, V. I.
Pavlikov, A. V.
Pavlov, K. A.
Pavlov, S. A.
Pavluš, M.
Pavolotsky, A. B.
Pchelina, D. I.
Pelenovich, V. O.
Pelipenko, D. I.
Peregudov, O. A.
Peregudova, E. N.
Perekalov, A. A.
Perov, N. S.
Pertsov, A. A.
Pesin, L. A.

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