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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

K

Kravchenko, I. V.
Kravchuk, K. S.
Kravchuk, L. V.
Kravets, N. A.
Kravtsov, E. A.
Kravtsova, A. N.
Kraynova, G. S.
Krechetov, I. S.
Kremlev, K. V.
Krichevtsov, B. B.
Kristya, V. I.
Krit, A. N.
Krit, T. B.
Krivchenko, V. A.
Kropachev, G.
Kropotov, G. I.
Krotov, Yu. A.
Kruglikov, S. S.
Kruglov, K. I.
Krumina, A. P.
Krupin, A. U.
Kryazhev, Yu. G.
Krylov, P. N.
Krysina, O. V.
Ksenich, S. V.

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