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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

K

Korovin, S. B.
Korovushkin, V. V.
Korshunov, S. N.
Kortov, V. S.
Koryazhkina, M. N.
Korzhov, V. P.
Kos’kova, T. V.
Koshcheev, V. P.
Koshkodaev, D. S.
Kosiachkin, Ye. N.
Kosovets, A. S.
Kostenkov, N. V.
Kostina, N. V.
Kostishin, V. G.
Kostyuchenko, A. V.
Kostyuchenko, S. A.
Kosushkin, V. G.
Kotina, G. V.
Kotomina, V. E.
Koval, N. N.
Kovalchuk, M. V.
Kovalenko, A. I.
Kovalenko, M. S.
Kovalenko, S. F.
Kovaleva, K. E.

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