Deformation of MEMS Transducer Membrane Due to Stress in Deposited Film
- Authors: Amelichev V.V.1, Generalov S.S.1, Godovitsyn I.V.1, Polomoshnov S.A.1, Saurov M.A.1
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Affiliations:
- Scientific-Manufacturing Complex “Technological Centre”
- Issue: Vol 54, No 5 (2025)
- Pages: 447-458
- Section: ТЕХНОЛОГИИ
- URL: https://journals.rcsi.science/0544-1269/article/view/353912
- DOI: https://doi.org/10.7868/S3034548025050088
- ID: 353912
Cite item
Abstract
About the authors
V. V. Amelichev
Scientific-Manufacturing Complex “Technological Centre”Zelenograd, Russia
S. S. Generalov
Scientific-Manufacturing Complex “Technological Centre”Zelenograd, Russia
I. V. Godovitsyn
Scientific-Manufacturing Complex “Technological Centre”
Email: I.Godovitsyn@tcen.ru
Zelenograd, Russia
S. A. Polomoshnov
Scientific-Manufacturing Complex “Technological Centre”Zelenograd, Russia
M. A. Saurov
Scientific-Manufacturing Complex “Technological Centre”Zelenograd, Russia
References
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