Structuring of the Surface of Thin Carbon Films During Activation by Microsecond Current Pulses

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Abstract

The influence of current activation by electric pulse breakdown on changes in surface morphology and emission characteristics of a field emission cathode made on the basis of carbon films obtained by deposition in a microwave gas discharge plasma was studied. Current activation of these films was carried out by applying voltage pulses of microsecond duration until an electrical breakdown occurred. It is shown that during activation, the morphology of the film surface in the breakdown region changes with the formation of a micro-sized emitting structure, which significantly improves the field emission characteristics of cathodes based on carbon films.

About the authors

D. V. Nefedov

Saratov Branch of Kotelnikov Institute of Radio Engineering and Electronics of the Russian Academy of Sciences

Author for correspondence.
Email: nefedov_dv@rambler.ru
Russian Federation, Saratov

N. O. Shabunin

Saratov State University

Email: nefedov_dv@rambler.ru
Russian Federation, Saratov

D. N. Bratashov

Saratov State University

Email: nefedov_dv@rambler.ru
Russian Federation, Saratov

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Supplementary files

Supplementary Files
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1. JATS XML
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2. Fig. 1. Occurrence of extreme initial current on the sample with resistance 29 kOhm (a), the beginning of current flow, dots - experimental data, solid line - approximation by exponential dependence (b)

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3. Fig. 2. Optical microscopy of the initial breakdown area (a) and electron microscopy of the initial breakdown area focusing on surface formations (b). Sample with a resistance of 29 kOhm

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4. Fig. 3. Optical microscopy of the initial breakdown area (a) and electron microscopy of the initial breakdown area focusing on surface formations (b). Sample with 230 kOhm resistance

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5. Fig. 4. Raman spectra for three samples with resistances: 1 - 29 kOhm, 2 - 72 kOhm, 3 - 230 kOhm (a); ratio of D and G band intensities (b)

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6. Fig. 5. VAC of samples of different resistances before breakdowns occurrence: 1 - 29 kOhm, 3 - 72 kOhm, 5 - 230 kOhm, and after: 2 - 29 kOhm, 4 - 72 kOhm, 6 - 230 kOhm (a); change of maximum current after breakdown as a function of sample resistance (b)

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7. Fig. 6. Optical microscopy of the film surface after breakdown (a), electron microscopy of the array of surface formations (b). Sample with a resistance of 29 kOhm

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