ВНИМАНИЮ АВТОРОВ - PDF (Russian)
Copyright (c) 2023 Russian Academy of Sciences
Copyright (c) 2023 Russian Academy of Sciences
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Keywords
Förster effect
bipolar transistor
charge qubit
diagnostics
dissociation
etching
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
resistive switching
silicon
simulation
testing
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Keywords
Förster effect
bipolar transistor
charge qubit
diagnostics
dissociation
etching
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
resistive switching
silicon
simulation
testing
Article Tools
Email this article (Login required)
Email the author (Login required)
Email this article (Login required)
Email the author (Login required) Copyright (c) 2023 Russian Academy of Sciences