Effect of internal chip stripes on susceptibility to supershort ultrawideband electromagnetic pulses
- 作者: Stepovik A.1, Shamaev E.1, Armanov M.1
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隶属关系:
- Zababakhin All-Russia Research Institute of Technical Physics
- 期: 卷 62, 编号 8 (2017)
- 页面: 910-915
- 栏目: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/198686
- DOI: https://doi.org/10.1134/S1064226917080137
- ID: 198686
如何引用文章
详细
Reversible functional failure of an ATmega 8515 microcontroller (MC) is used to demonstrate the importance of internal stripes of chips in radio-transparent package in the analysis of susceptibility of microelectronic components to radio-frequency radiation. Experiments under different conditions for MC irradiation are performed and induced electric voltages are calculated using the simplest model of antenna reception. The calculated results are in qualitative agreement with the experimental data.
作者简介
A. Stepovik
Zababakhin All-Russia Research Institute of Technical Physics
编辑信件的主要联系方式.
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, Chelyabinsk oblast, 456770
E. Shamaev
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, Chelyabinsk oblast, 456770
M. Armanov
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, Chelyabinsk oblast, 456770