Effect of internal chip stripes on susceptibility to supershort ultrawideband electromagnetic pulses
- Авторы: Stepovik A.1, Shamaev E.1, Armanov M.1
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Учреждения:
- Zababakhin All-Russia Research Institute of Technical Physics
- Выпуск: Том 62, № 8 (2017)
- Страницы: 910-915
- Раздел: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/198686
- DOI: https://doi.org/10.1134/S1064226917080137
- ID: 198686
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Аннотация
Reversible functional failure of an ATmega 8515 microcontroller (MC) is used to demonstrate the importance of internal stripes of chips in radio-transparent package in the analysis of susceptibility of microelectronic components to radio-frequency radiation. Experiments under different conditions for MC irradiation are performed and induced electric voltages are calculated using the simplest model of antenna reception. The calculated results are in qualitative agreement with the experimental data.
Об авторах
A. Stepovik
Zababakhin All-Russia Research Institute of Technical Physics
Автор, ответственный за переписку.
Email: dep5@vniitf.ru
Россия, Snezhinsk, Chelyabinsk oblast, 456770
E. Shamaev
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, Chelyabinsk oblast, 456770
M. Armanov
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, Chelyabinsk oblast, 456770