Email this article Effect of internal chip stripes on susceptibility to supershort ultrawideband electromagnetic pulses
- Authors: Stepovik A.P.1, Shamaev E.Y.1, Armanov M.M.1
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Affiliations:
- Zababakhin All-Russia Research Institute of Technical Physics
- Issue: Vol 62, No 8 (2017)
- Pages: 910-915
- Section: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/198686
- DOI: https://doi.org/10.1134/S1064226917080137
- ID: 198686
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Abstract
Reversible functional failure of an ATmega 8515 microcontroller (MC) is used to demonstrate the importance of internal stripes of chips in radio-transparent package in the analysis of susceptibility of microelectronic components to radio-frequency radiation. Experiments under different conditions for MC irradiation are performed and induced electric voltages are calculated using the simplest model of antenna reception. The calculated results are in qualitative agreement with the experimental data.
About the authors
A. P. Stepovik
Zababakhin All-Russia Research Institute of Technical Physics
Author for correspondence.
Email: dep5@vniitf.ru
Russian Federation, Snezhinsk, Chelyabinsk oblast, 456770
E. Yu. Shamaev
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Russian Federation, Snezhinsk, Chelyabinsk oblast, 456770
M. M. Armanov
Zababakhin All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Russian Federation, Snezhinsk, Chelyabinsk oblast, 456770
