Study of Photodiodes Based on the InGaAs Structure with a Boundary Wavelength of 2.06 μm


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Abstract

IV characteristics and spectral photosensitivities of photodiodes based on epitaxially grown hydrides of metal-organic compounds (MOC-hydride epitaxy) of epitaxial structures with the In0.67Ga0.33As absorbing layer doped with Zn on the InP substrates are studied. The photodiodes are fabricated using the mesatechnology. The long-wavelength boundary of the spectral photosensitivity of diodes measured at half-maximum is 2.06 μm at room temperature. Photosensitivity spectra are studied in a temperature interval of 230–300 K.

About the authors

K. O. Boltar

Orion R&P Association; Moscow Institute of Physics and Technology (State University)

Author for correspondence.
Email: orion@orion-ir.ru
Russian Federation, Moscow, 111538; Dolgoprudnyi, Moscow oblast, 141700

N. A. Irodov

Orion R&P Association

Email: bereg@niipolyus.ru
Russian Federation, Moscow, 111538

M. V. Sednev

Orion R&P Association

Email: bereg@niipolyus.ru
Russian Federation, Moscow, 111538

A. A. Marmalyuk

Stel’makh Research Institute “Polyus”

Author for correspondence.
Email: bereg@niipolyus.ru
Russian Federation, Moscow, 117342

M. A. Ladugin

Orion R&P Association

Email: bereg@niipolyus.ru
Russian Federation, Moscow, 111538

Yu. L. Ryaboshtan

Stel’makh Research Institute “Polyus”

Email: bereg@niipolyus.ru
Russian Federation, Moscow, 117342


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