Calculating the High-Frequency Electrical Conductivity of a Thin Metallic Layer for an Ellipsoidal Fermi Surface
- 作者: Kuznetsova I.1, Romanov D.1, Yushkanov A.2
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隶属关系:
- Demidov Yaroslavl State University
- Moscow Region State University
- 期: 卷 47, 编号 3 (2018)
- 页面: 201-210
- 栏目: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186835
- DOI: https://doi.org/10.1134/S1063739718030071
- ID: 186835
如何引用文章
详细
The conductivity of a thin metallic layer in an ac electric field is calculated with respect to different specular reflection coefficients of the layer surfaces for an ellipsoidal Fermi surface. The ratio between the free path of electron conduction and layer thickness is not limited. The dependences of the absolute value and the argument of dimensionless conductivity on the dimensionless layer’s thickness, dimensionless external electric field frequency, and specular reflection coefficient of one of the layer surfaces at different ellipticity parameters of the Fermi surface are analyzed.
作者简介
I. Kuznetsova
Demidov Yaroslavl State University
编辑信件的主要联系方式.
Email: kuz@uniyar.ac.ru
俄罗斯联邦, Yaroslavl, 150003
D. Romanov
Demidov Yaroslavl State University
Email: kuz@uniyar.ac.ru
俄罗斯联邦, Yaroslavl, 150003
A. Yushkanov
Moscow Region State University
Email: kuz@uniyar.ac.ru
俄罗斯联邦, Moscow, 105005