Calculating the High-Frequency Electrical Conductivity of a Thin Metallic Layer for an Ellipsoidal Fermi Surface
- Authors: Kuznetsova I.A.1, Romanov D.N.1, Yushkanov A.A.2
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Affiliations:
- Demidov Yaroslavl State University
- Moscow Region State University
- Issue: Vol 47, No 3 (2018)
- Pages: 201-210
- Section: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186835
- DOI: https://doi.org/10.1134/S1063739718030071
- ID: 186835
Cite item
Abstract
The conductivity of a thin metallic layer in an ac electric field is calculated with respect to different specular reflection coefficients of the layer surfaces for an ellipsoidal Fermi surface. The ratio between the free path of electron conduction and layer thickness is not limited. The dependences of the absolute value and the argument of dimensionless conductivity on the dimensionless layer’s thickness, dimensionless external electric field frequency, and specular reflection coefficient of one of the layer surfaces at different ellipticity parameters of the Fermi surface are analyzed.
About the authors
I. A. Kuznetsova
Demidov Yaroslavl State University
Author for correspondence.
Email: kuz@uniyar.ac.ru
Russian Federation, Yaroslavl, 150003
D. N. Romanov
Demidov Yaroslavl State University
Email: kuz@uniyar.ac.ru
Russian Federation, Yaroslavl, 150003
A. A. Yushkanov
Moscow Region State University
Email: kuz@uniyar.ac.ru
Russian Federation, Moscow, 105005