Calculating the High-Frequency Electrical Conductivity of a Thin Metallic Layer for an Ellipsoidal Fermi Surface


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Abstract

The conductivity of a thin metallic layer in an ac electric field is calculated with respect to different specular reflection coefficients of the layer surfaces for an ellipsoidal Fermi surface. The ratio between the free path of electron conduction and layer thickness is not limited. The dependences of the absolute value and the argument of dimensionless conductivity on the dimensionless layer’s thickness, dimensionless external electric field frequency, and specular reflection coefficient of one of the layer surfaces at different ellipticity parameters of the Fermi surface are analyzed.

About the authors

I. A. Kuznetsova

Demidov Yaroslavl State University

Author for correspondence.
Email: kuz@uniyar.ac.ru
Russian Federation, Yaroslavl, 150003

D. N. Romanov

Demidov Yaroslavl State University

Email: kuz@uniyar.ac.ru
Russian Federation, Yaroslavl, 150003

A. A. Yushkanov

Moscow Region State University

Email: kuz@uniyar.ac.ru
Russian Federation, Moscow, 105005


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