System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

O. A. Kalashnikov; P. V. Nekrasov; A. Yu. Nikiforov; V. A. Telets; G. V. Chukov; V. V. Elesin

doi:10.1134/S1063739716010066

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

Authors: Kalashnikov O.A.¹, Nekrasov P.V.¹, Nikiforov A.Y.¹, Telets V.A.¹, Chukov G.V.¹, Elesin V.V.¹
Affiliations:
1. National Research Nuclear University MEPhI, ENPO SPELS
Issue: Vol 45, No 1 (2016)
Pages: 33-40
Section: Article
URL: https://journals.rcsi.science/1063-7397/article/view/185518
DOI: https://doi.org/10.1134/S1063739716010066
ID: 185518

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Abstract

The analysis results of typical radiation faults of the system-on-chip have been presented. The specifics of digital, analog-to-digital (mixed), and microwave system-on-chip are considered. A set of the basic parameters-criteria for the radiation hardness of system-on-chip of various classes is determined. Methodical and technical designs for controlling the operability of the System-on-chip by carrying out radiation tests are proposed.