Effect of ultrathin C60 fullerene films on the surface conductivity of a Si(111) substrate with ordered adsorbate reconstructions
- Авторлар: Tsukanov D.A.1,2, Ryzhkova M.V.1,2, Borisenko E.A.1,2, Ivanchenko M.V.1,2
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Мекемелер:
- Institute of Automation and Control Processes
- Far Eastern Federal University
- Шығарылым: Том 10, № 4 (2016)
- Беттер: 864-867
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/189494
- DOI: https://doi.org/10.1134/S1027451016040388
- ID: 189494
Дәйексөз келтіру
Аннотация
The correlation between the surface conductivity and crystal structure of the reconstructed surface of Si(111) samples after thre room-temperature deposition of C60 fullerene molecules is investigated in situ by four-probe conductivity measurements and low-energy electron diffraction. It is shown that the electrical conductivity of ultrathin fullerenes layers on these surfaces depends on their coverage and type of surface reconstructions. The possibility of forming ultrathin NaC60 films on the reconstructed surface of Si(111)-h-√3 × √3-(Au,Na) is demonstrated.
Негізгі сөздер
Авторлар туралы
D. Tsukanov
Institute of Automation and Control Processes; Far Eastern Federal University
Хат алмасуға жауапты Автор.
Email: tsukanov@iacp.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690950
M. Ryzhkova
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690950
E. Borisenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690950
M. Ivanchenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690950
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