Effect of ultrathin C60 fullerene films on the surface conductivity of a Si(111) substrate with ordered adsorbate reconstructions
- 作者: Tsukanov D.A.1,2, Ryzhkova M.V.1,2, Borisenko E.A.1,2, Ivanchenko M.V.1,2
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隶属关系:
- Institute of Automation and Control Processes
- Far Eastern Federal University
- 期: 卷 10, 编号 4 (2016)
- 页面: 864-867
- 栏目: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/189494
- DOI: https://doi.org/10.1134/S1027451016040388
- ID: 189494
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详细
The correlation between the surface conductivity and crystal structure of the reconstructed surface of Si(111) samples after thre room-temperature deposition of C60 fullerene molecules is investigated in situ by four-probe conductivity measurements and low-energy electron diffraction. It is shown that the electrical conductivity of ultrathin fullerenes layers on these surfaces depends on their coverage and type of surface reconstructions. The possibility of forming ultrathin NaC60 films on the reconstructed surface of Si(111)-h-√3 × √3-(Au,Na) is demonstrated.
作者简介
D. Tsukanov
Institute of Automation and Control Processes; Far Eastern Federal University
编辑信件的主要联系方式.
Email: tsukanov@iacp.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690950
M. Ryzhkova
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690950
E. Borisenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690950
M. Ivanchenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
俄罗斯联邦, Vladivostok, 690041; Vladivostok, 690950
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