Effect of ultrathin C60 fullerene films on the surface conductivity of a Si(111) substrate with ordered adsorbate reconstructions

Resumo

The correlation between the surface conductivity and crystal structure of the reconstructed surface of Si(111) samples after thre room-temperature deposition of C₆₀ fullerene molecules is investigated in situ by four-probe conductivity measurements and low-energy electron diffraction. It is shown that the electrical conductivity of ultrathin fullerenes layers on these surfaces depends on their coverage and type of surface reconstructions. The possibility of forming ultrathin NaC₆₀ films on the reconstructed surface of Si(111)-h-√3 × √3-(Au,Na) is demonstrated.