Effect of ultrathin C60 fullerene films on the surface conductivity of a Si(111) substrate with ordered adsorbate reconstructions
- Authors: Tsukanov D.A.1,2, Ryzhkova M.V.1,2, Borisenko E.A.1,2, Ivanchenko M.V.1,2
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Affiliations:
- Institute of Automation and Control Processes
- Far Eastern Federal University
- Issue: Vol 10, No 4 (2016)
- Pages: 864-867
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/189494
- DOI: https://doi.org/10.1134/S1027451016040388
- ID: 189494
Cite item
Abstract
The correlation between the surface conductivity and crystal structure of the reconstructed surface of Si(111) samples after thre room-temperature deposition of C60 fullerene molecules is investigated in situ by four-probe conductivity measurements and low-energy electron diffraction. It is shown that the electrical conductivity of ultrathin fullerenes layers on these surfaces depends on their coverage and type of surface reconstructions. The possibility of forming ultrathin NaC60 films on the reconstructed surface of Si(111)-h-√3 × √3-(Au,Na) is demonstrated.
About the authors
D. A. Tsukanov
Institute of Automation and Control Processes; Far Eastern Federal University
Author for correspondence.
Email: tsukanov@iacp.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690950
M. V. Ryzhkova
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690950
E. A. Borisenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690950
M. V. Ivanchenko
Institute of Automation and Control Processes; Far Eastern Federal University
Email: tsukanov@iacp.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690950
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