Study into the properties of TiN/WN multilayer nanocoatings prepared via magnetron sputtering
- Авторлар: Bodnarchuk V.I.1, Petrov P.2, Kozlenko D.P.1, Dechev D.2, Ivanov N.2, Martev I.2, Kasatkin I.A.3
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Мекемелер:
- Joint Institute for Nuclear Research
- Institute of Electronics
- St. Petersburg State University
- Шығарылым: Том 11, № 1 (2017)
- Беттер: 186-189
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/191541
- DOI: https://doi.org/10.1134/S1027451017010244
- ID: 191541
Дәйексөз келтіру
Аннотация
Titanium-nitride (TiN) and tungsten-nitride (WN) thin films with a layer thickness of 6 nm, which are obtained via magnetron sputtering on silicon substrates, are studied. The structural and mechanical properties are presented.
Негізгі сөздер
Авторлар туралы
V. Bodnarchuk
Joint Institute for Nuclear Research
Хат алмасуға жауапты Автор.
Email: bodnarch@nf.jinr.ru
Ресей, Dubna, Moscow oblast, 141980
P. Petrov
Institute of Electronics
Email: bodnarch@nf.jinr.ru
Болгария, Sofia, 1784
D. Kozlenko
Joint Institute for Nuclear Research
Email: bodnarch@nf.jinr.ru
Ресей, Dubna, Moscow oblast, 141980
D. Dechev
Institute of Electronics
Email: bodnarch@nf.jinr.ru
Болгария, Sofia, 1784
N. Ivanov
Institute of Electronics
Email: bodnarch@nf.jinr.ru
Болгария, Sofia, 1784
I. Martev
Institute of Electronics
Email: bodnarch@nf.jinr.ru
Болгария, Sofia, 1784
I. Kasatkin
St. Petersburg State University
Email: bodnarch@nf.jinr.ru
Ресей, St. Petersburg, 199034
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