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Том 13, № 4 (2019)
Optimization of the Electron Optical System of a Scanning Electron Microscope for Measuring the Size of Micro- and Nanoobjects
Kazmiruk V., Kurganov I., Podkopaev A., Savitskaya T.
PDF
(Eng)
Том 12, № 3 (2018)
Monte Carlo Method in Scanning Electron Microscopy. 3. Modern Condition of the Problem
Novikov Y.
PDF
(Eng)
Том 12, № 1 (2018)
Monte Carlo Method in Scanning Electron Microscopy. 2. Problems and Solutions
Novikov Y.
PDF
(Eng)
Том 12, № 6 (2018)
Depth Profiling Using Reflected Electron Spectroscopy
Afanas’ev V., Bodisko Y., Gryazev A., Kaplya P., Fedorovich S.
PDF
(Eng)
Том 12, № 3 (2018)
Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
Volkov R., Borgardt N., Gromov D., Dubkov S.
PDF
(Eng)
Том 12, № 2 (2018)
Heating of a Thin Crystal Target at the Passage of High-Energy Short Electron Bunches
Babaev A., Gogolev A.
PDF
(Eng)
Том 10, № 5 (2016)
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V., Kurganov I., Osipov N., Podkopaev A., Savitskaya T.
PDF
(Eng)
Том 13, № 5 (2019)
Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy
Afanas’ev V., Gryazev A., Kaplya P., Köppen M., Rybakova A.
PDF
(Eng)
Том 12, № 3 (2018)
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
PDF
(Eng)
Том 11, № 4 (2017)
Monte Carlo method in scanning electron microscopy. 1. Modeling and experiment
Novikov Y.
PDF
(Eng)
Том 11, № 4 (2017)
Differential inverse inelastic mean free paths and differential surface excitation probability in aluminium in the energy range of 0.5–120 keV
Afanas’ev V., Gryazev A., Kaplya P., Ridzel O.
PDF
(Eng)
Том 10, № 4 (2016)
Experimental determination of the energy dependence of electron inelastic mean free path in silicon oxide and silicon nitride
Garmash V., Djuzhev N., Kirilenko E., Makhiboroda M., Migunov D.
PDF
(Eng)
Том 10, № 2 (2016)
Ion energy losses during the charge-exchange process
Belkova Y., Novikov N., Teplova Y.
PDF
(Eng)
Том 13, № 5 (2019)
Modification of the Nanoglobular Structure of Glassy Carbon by Heat Treatment and Ion Irradiation
Andrianova N., Borisov A., Kazakov V., Makunin A., Mashkova E., Ovchinnikov M.
PDF
(Eng)
Том 10, № 2 (2016)
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.
PDF
(Eng)
Том 11, № 2 (2017)
Study of the optimum conditions of a vacuum holographic microscope
Egorov N., Gileva A., Antonova L., Trofimov V., Karpov A.
PDF
(Eng)
Том 10, № 2 (2016)
Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V., Knyazev E., Sten’kin Y., Ivlev K.
PDF
(Eng)
Том 13, № 5 (2019)
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y., Borgardt N., Lazarenko P., Parsegova V., Prikhodko A., Sherchenkov A.
PDF
(Eng)
Том 13, № 4 (2019)
Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV
Mikheev N.
PDF
(Eng)
Том 11, № 1 (2017)
Features of the crystalline state of graphite layers
Borisowskiy P., Moos E., Rudenko A.
PDF
(Eng)
Том 10, № 2 (2016)
Small-angle approximation and Oswald–Kasper–Gaukler theory of electron reflection from solids
Afanas’ev V., Kaplya P., Lisitsyna E.
PDF
(Eng)
Том 10, № 1 (2016)
Intrinsic excitation effect for the Al and Mg samples XPS analysis
Afanas’ev V., Gryazev A., Kaplya P., Andreyeva Y.
PDF
(Eng)
Том 13, № 4 (2019)
Interaction of Photons with Electrons of a Metal during the Irradiation of Its Surface in Vector-Potential Space
Volobuev A., Lukachev S., Tolstonogov A., Kolomin I.
PDF
(Eng)
Том 12, № 6 (2018)
Determination of the Thickness of Nanofilms Using X-Ray Photoelectron Spectroscopy
Kaplya P., Efremenko D., Afanas’ev V.
PDF
(Eng)
Том 11, № 2 (2017)
Studying the formation of a true-secondary-electron signal in the low-voltage SEM mode
Kazmiruk V., Kurganov I., Osipov N., Podkopaev A., Savitskaya T.
PDF
(Eng)
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