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Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
On the thermal oxidation of VxOy–InP heterostructures formed by the centrifugation of vanadium(V) oxide gel
Sladkopevtsev B.V., Tomina E.V., Mittova I.Y., Dontsov A.I., Pelipenko D.I.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
Influence of the probe sizes on the parameters of the surface morphology of hemispherical-grain polysilicon films: Estimation via atomic-force microscopy
Novak A.V., Novak V.R.
Electrical Activity of Surface Steps on a Sapphire Crystal Substrate for Epitaxy
Vlasov V.P., Kanevsky V.M., Butashin A.V., Muslimov A.E.
Surface morphology and electrocatalytic properties of nickel nanoparticles formed in track pores
Ziganshina S.A., Chuklanov A.P., Biziaev D.A., Bukharaev A.A.
Butyl-Xanthate Adsorption on the Surface of Sulfide Minerals under Conditions of their Preliminary Treatment with Water Electrolysis Products according to Atomic-Force Microscopy and Infrared Fourier Spectroscopy Data
Koporulina E.V., Ryazantseva M.V., Chanturiya E.L., Zhuravleva E.S.
Formation of intrinsic oxide nanocrystals on the surface of GaSe under laser irradiation
Novikov V.A., Sarkisov S.Y.
Atomic-Force-Microscopy Analysis of Uranium Bis-Phthalocyanine and Its Pyrolysed Derivatives
Bairamukov V.Y., Lebedev V.T., Tikhonov V.I.
Features of determination of the surface roughness using scanning probe microscopy
Novikov V.A.
Influence of Focused Pulsed Laser Radiation on the Properties of Amorphous FeSi6B16 Metal Alloy
Zhikharev A.V., Bayankin V.Y., Bystrov S.G., Orlova N.A.
Evolution of surface morphology during the growth of amorphous and polycrystalline silicon films
Novak A.V., Novak V.R., Smirnov D.I.
AFM study of thin films of oligopeptide L-valyl-L-valine before and after interaction with vapors
Ziganshin M.A., Gubina N.S., Gorbatchuk V.V., Ziganshina S.A., Chuklanov A.P., Bizyaev D.A., Bukharaev A.A.
Solid-Phase Interaction in Fullerite-Bismuth Films in the Process of Thermal Annealing
Baran L.V.
Investigation of the surface-potential distribution of epitaxial CdHgTe films
Novikov V.A., Grigoryev D.V., Voitsekhovskii A.V., Dvoretsky S.A., Mikhailov N.N.
Atomic-Force Microscopy in the Study of the Tribological Characteristics of Thin Al−Si−N Coatings
Kuznetsova T.A., Zubar T.I., Lapitskaya V.A., Sudilovskaya K.A., Chizhik S.A., Uglov V.V., Shimanskii V.I., Kvasov N.T.
Effect of residual atmospheric pressure on the development of electrostatic discharges at the surface of protective glasses of solar cells
Khasanshin R.H., Novikov L.S., Korovin S.B.
1 - 18 of 18 Items

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