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Orientational dependence of the creation and annihilation of electron–positron pairs in a single-crystal at high energies
Kalashnikov N.P., Olchak A.S.
On some problems of modeling the distributions of minority charge carriers generated by an electron beam in a semiconductor material
Seregina E.V., Stepovich M.A., Makarenkov A.M., Filippov M.N.
Symmetry properties of the phase of coexistence of superconductivity and antiferromagnetism in 2D systems with strong electron correlations
Val’kov V.V., Zlotnikov A.O.
Structural Phase State of Surface Alloyed Y2O3 Silumin After Electron beam Processing
Gromov V.E., Ivanov Y.F., Zagulyaev D.V., Petrikova E.A., Teresov A.D., Rubannikova Y.A., Semin A.P.
Transformation of the Electronic Characteristics of Ytterbium Nanofilms, Induced by Carbon-Monoxide Molecules Adsorbed on Their Surface
Kuzmin M.V., Mittsev M.A.
Formation and Evolution of Structure and Phase Composition of Hypoeutectoid Silumin on Electron Beam Processing
Semin A.P., Rubannikova Y.A., Ivanov Y.F., Gromov V.E., Zagulyaev D.V., Konovalov S.V.
Estimating the Crystallographic Structure of AlGaN/GaN Heterostructure Buffer Layers Using Symmetric and Asymmetric X-ray Schemes
Lutzau A.V., Temper E.M., Enisherlova K.L.
Test Object for SEM Calibration: 2. Correlation Analysis of SEM Signals
Novikov Y.A.
Synthesis of Rhenium-Silicide Microcrystals in a Tin Melt
Solomkin F.Y., Orekhov A.S., Sharenkova N.V., Khavrov G.D., Isachenko G.N., Zaitseva N.V., Klechkovskaya V.V.
Effect of High-Fluence Ion Irradiation on the Structure and Electrical Properties of Polycrystalline Diamond
Anikin V.A., Borisov A.M., Kazakov V.A., Kudrin A.V., Mashkova E.S., Morkovkin A.I., Ovchinnikov M.A., Pitirimova E.A.
Influence of Zn+-Ion Implantation on the Process of Sapphire Charging by an Electron Beam
Tatarintsev A.A., Privezentsev V.V., Rau E.I., Goryachev A.V.
Transmission Function: Effect of “Brightness-Body Rotation”
Afanas’ev V.P., Kaplya P.S.
Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope
Rau E.I., Tatarintsev A.A., Kupreenko S.Y., Zaitsev S.V., Podbutsky N.G.
Algorithm for solving the inverse vibronic problem on the basis of SVL fluorescence spectra
Chernavina M.L., Novoselova A.V., Berezin K.V., Likhter A.M., Gaisina A.R., Stepanovich E.Y., Kartashov M.V., Egorenkova T.A., Antonova E.M., Grechukhina O.N.
Electron microscopy studies of crystallites in carbon nanopillars grown by low-temperature plasma-enhanced chemical-vapor deposition
Grishina Y.S., Borgardt N.I., Volkov R.L., Gromov D.G., Dubkov S.V.
Effective concentration of electrons in metals upon measurements via positron annihilation spectroscopy
Grafutin V.I., Prokopiev E.P., Khmelevsky N.O.
Electron and probe microscopy investigation of the surface of elastomers modified with antifriction fillers
Stolyarova O.O., Muravyeva T.I., Gainutdinov R.V., Morozov A.V., Zagorskiy D.L., Petrova N.N., Portnyagina V.V.
EPR and photoluminescence spectra of smooth CDx films from T-10 tokamak: The effect of iron impurity
Svechnikov N.Y., Stankevich V.G., Lebedev A.M., Sukhanov L.P., Menshikov K.A.
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