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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

B

Belonogov, E. K.
Belosludzev, A. V.
Belotserkovskii, M. A.
Belous, A. G.
Belous, W.
Belousov, S. I.
Belova, N. E.
Belozerova, A. A.
Belozerova, O. Yu.
Beltiukov, A. N.
Belugina, N. V.
Belushkin, A. V.
Belyaev, S. N.
Belyanin, A. F.
Belykh, S. F.
Bembel, A. G.
Bendre, S. T.
Berdnikova, M. M.
Berezin, K. V.
Berezkin, V. V.
Berezovsky, V. S.
Berov, Z. Zh.
Berzhansky, V. N.
Beshenkov, V. G.
Beskrovnyi, A.

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