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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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D

Demina, T. V.
Demkiv, A. A.
Demyanov, B. F.
Denisov, A. E.
Dergacheva, E. V.
Didenko, G. P.
Dideykin, A. T.
Didyk, A. Yu.
Dikaya, O. A.
Dimova, S. N.
Djabbarganov, R.
Djuzhev, N. A.
Dmitrienko, V. E.
Dmitriev, A. M.
Dmitriev, V. P.
Dmitrieva, M. S.
Dmitryakov, P. V.
Dobrovolskiy, S. V.
Dolbin, I. V.
Dolgintsev, D. M.
Dolzhikov, S. V.
Domoroshchina, E. N.
Domracheva, N. E.
Donaev, S. B.
Dontsov, A. I.

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