Email this article Neutron Reflectometry Studies of ZnO Films
- Authors: Zhaketov V.D.1, Chitanu E.2, Nikitenko Y.V.1
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Affiliations:
- Joint Institute for Nuclear Research
- National Institute for Electrical Engineering ICPE-CA
- Issue: Vol 12, No 4 (2018)
- Pages: 658-664
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/195711
- DOI: https://doi.org/10.1134/S1027451018040195
- ID: 195711
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Abstract
Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10–20 nm.
About the authors
V. D. Zhaketov
Joint Institute for Nuclear Research
Email: nikiten@nf.jinr.ru
Russian Federation, Dubna, Moscow oblast, 141980
E. Chitanu
National Institute for Electrical Engineering ICPE-CA
Email: nikiten@nf.jinr.ru
Romania, Bucharest
Yu. V. Nikitenko
Joint Institute for Nuclear Research
Author for correspondence.
Email: nikiten@nf.jinr.ru
Russian Federation, Dubna, Moscow oblast, 141980
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