Surface Reactivity of Single-Crystal Silicon in Atomic Layer Deposition Processes
- Авторлар: Ezhovskii Y.K.1
-
Мекемелер:
- St. Petersburg State Technological Institute (Technical University)
- Шығарылым: Том 55, № 2 (2019)
- Беттер: 101-105
- Бөлім: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/158634
- DOI: https://doi.org/10.1134/S0020168519020031
- ID: 158634
Дәйексөз келтіру
Аннотация
A macromolecular concept of the structure of solids and induction constants are used to quantitatively assess the reactivity of hydroxyl groups on the surface of single-crystal matrices, as exemplified by silicon. The oxide layer on the surface of such matrices is shown to influence the reactivity of silanol groups in atomic layer deposition processes.
Негізгі сөздер
Авторлар туралы
Yu. Ezhovskii
St. Petersburg State Technological Institute (Technical University)
Хат алмасуға жауапты Автор.
Email: ezhovski1@mail.ru
Ресей, Moskovskii pr. 26, St. Petersburg, 190013
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