Email this article Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
- Authors: Kulikov N.A.1, Popov V.D.1, Chubunov P.A.1
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Affiliations:
- Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
- Issue: Vol 56, No 5 (2018)
- Pages: 400-404
- Section: Brief Communications
- URL: https://journals.rcsi.science/0010-9525/article/view/153462
- DOI: https://doi.org/10.1134/S0010952518050040
- ID: 153462
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Abstract
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
About the authors
N. A. Kulikov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Author for correspondence.
Email: nikita93-07@bk.ru
Russian Federation, Moscow, 115409
V. D. Popov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Russian Federation, Moscow, 115409
P. A. Chubunov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Russian Federation, Moscow, 115409
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