电邮这篇文章 Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
- 作者: Kulikov N.A.1, Popov V.D.1, Chubunov P.A.1
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隶属关系:
- Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
- 期: 卷 56, 编号 5 (2018)
- 页面: 400-404
- 栏目: Brief Communications
- URL: https://journals.rcsi.science/0010-9525/article/view/153462
- DOI: https://doi.org/10.1134/S0010952518050040
- ID: 153462
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详细
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
作者简介
N. Kulikov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
编辑信件的主要联系方式.
Email: nikita93-07@bk.ru
俄罗斯联邦, Moscow, 115409
V. Popov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
俄罗斯联邦, Moscow, 115409
P. Chubunov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
俄罗斯联邦, Moscow, 115409
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