Мақаланы E-mail арқылы жіберу Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
- Авторлар: Kulikov N.A.1, Popov V.D.1, Chubunov P.A.1
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Мекемелер:
- Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
- Шығарылым: Том 56, № 5 (2018)
- Беттер: 400-404
- Бөлім: Brief Communications
- URL: https://journals.rcsi.science/0010-9525/article/view/153462
- DOI: https://doi.org/10.1134/S0010952518050040
- ID: 153462
Дәйексөз келтіру
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Рұқсат берілді
Тек жазылушылар үшін
Аннотация
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
Авторлар туралы
N. Kulikov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Хат алмасуға жауапты Автор.
Email: nikita93-07@bk.ru
Ресей, Moscow, 115409
V. Popov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Ресей, Moscow, 115409
P. Chubunov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Ресей, Moscow, 115409
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