Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
- Авторы: Kulikov N.A.1, Popov V.D.1, Chubunov P.A.1
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Учреждения:
- Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
- Выпуск: Том 56, № 5 (2018)
- Страницы: 400-404
- Раздел: Brief Communications
- URL: https://journals.rcsi.science/0010-9525/article/view/153462
- DOI: https://doi.org/10.1134/S0010952518050040
- ID: 153462
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Аннотация
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
Об авторах
N. Kulikov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Автор, ответственный за переписку.
Email: nikita93-07@bk.ru
Россия, Moscow, 115409
V. Popov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Россия, Moscow, 115409
P. Chubunov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Россия, Moscow, 115409
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