Enviar artigo por via de e-mail Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
- Autores: Kulikov N.A.1, Popov V.D.1, Chubunov P.A.1
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Afiliações:
- Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
- Edição: Volume 56, Nº 5 (2018)
- Páginas: 400-404
- Seção: Brief Communications
- URL: https://journals.rcsi.science/0010-9525/article/view/153462
- DOI: https://doi.org/10.1134/S0010952518050040
- ID: 153462
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Resumo
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
Sobre autores
N. Kulikov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Autor responsável pela correspondência
Email: nikita93-07@bk.ru
Rússia, Moscow, 115409
V. Popov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Rússia, Moscow, 115409
P. Chubunov
Moscow Institute of Engineering Physics (National Research Nuclear University MEPhI)
Email: nikita93-07@bk.ru
Rússia, Moscow, 115409
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