Goodness-of-Fit Test Based on Biinomial Probability Distribution
- Авторлар: Kuleshov E.L.1, Petrov K.A.1, Kirillova T.S.1, Khaliullin R.A.1
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Мекемелер:
- Far Eastern Federal University
- Шығарылым: Том 54, № 1 (2018)
- Беттер: 90-96
- Бөлім: Analysis and Synthesis of Signals and Images
- URL: https://journals.rcsi.science/8756-6990/article/view/212372
- DOI: https://doi.org/10.3103/S8756699018010144
- ID: 212372
Дәйексөз келтіру
Аннотация
This paper describes the goodness-of-fit test based on binomial probability distribution, which reduces to a sequence of bilateral hypothesis test for the value of the probability distribution function with different values of its argument. It is shown that each element of this sequence is unbiased locally by the most powerful test. This paper proposes an algorithm for calculating the significance level, free of probability distributions. The quality of this test is evaluated by numerical modeling.
Негізгі сөздер
Авторлар туралы
E. Kuleshov
Far Eastern Federal University
Хат алмасуға жауапты Автор.
Email: kuleshov.el@dvfu.ru
Ресей, ul. Sukhanov 8, Vladivostok, 690950
K. Petrov
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Ресей, ul. Sukhanov 8, Vladivostok, 690950
T. Kirillova
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Ресей, ul. Sukhanov 8, Vladivostok, 690950
R. Khaliullin
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Ресей, ul. Sukhanov 8, Vladivostok, 690950
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