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Optoelectronics, Instrumentation and Data Processing
ISSN 8756-6990 (Print) ISSN 1934-7944 (Online)
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
Home > Search > Browse Section Index

Browse Section Index

  • Analysis and Synthesis of Signals and Images
  • Automation Systems in Scientific Research and Industry
  • Computation and Information Measurement Systems
  • Computational and Data Acquisition Systems
  • Diffractive Optics
  • Erratum
  • Interference Systems and Devices
  • Modeling in Physical and Technical Research
  • Nanotechnologies in Optics and Electronics
  • Optical Information Technologies
  • Physical and Engineering Fundamentals of Microelectronics and Optoelectronics
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