Goodness-of-Fit Test Based on Biinomial Probability Distribution
- 作者: Kuleshov E.L.1, Petrov K.A.1, Kirillova T.S.1, Khaliullin R.A.1
-
隶属关系:
- Far Eastern Federal University
- 期: 卷 54, 编号 1 (2018)
- 页面: 90-96
- 栏目: Analysis and Synthesis of Signals and Images
- URL: https://journals.rcsi.science/8756-6990/article/view/212372
- DOI: https://doi.org/10.3103/S8756699018010144
- ID: 212372
如何引用文章
详细
This paper describes the goodness-of-fit test based on binomial probability distribution, which reduces to a sequence of bilateral hypothesis test for the value of the probability distribution function with different values of its argument. It is shown that each element of this sequence is unbiased locally by the most powerful test. This paper proposes an algorithm for calculating the significance level, free of probability distributions. The quality of this test is evaluated by numerical modeling.
作者简介
E. Kuleshov
Far Eastern Federal University
编辑信件的主要联系方式.
Email: kuleshov.el@dvfu.ru
俄罗斯联邦, ul. Sukhanov 8, Vladivostok, 690950
K. Petrov
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
俄罗斯联邦, ul. Sukhanov 8, Vladivostok, 690950
T. Kirillova
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
俄罗斯联邦, ul. Sukhanov 8, Vladivostok, 690950
R. Khaliullin
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
俄罗斯联邦, ul. Sukhanov 8, Vladivostok, 690950
补充文件
