Goodness-of-Fit Test Based on Biinomial Probability Distribution
- Authors: Kuleshov E.L.1, Petrov K.A.1, Kirillova T.S.1, Khaliullin R.A.1
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Affiliations:
- Far Eastern Federal University
- Issue: Vol 54, No 1 (2018)
- Pages: 90-96
- Section: Analysis and Synthesis of Signals and Images
- URL: https://journals.rcsi.science/8756-6990/article/view/212372
- DOI: https://doi.org/10.3103/S8756699018010144
- ID: 212372
Cite item
Abstract
This paper describes the goodness-of-fit test based on binomial probability distribution, which reduces to a sequence of bilateral hypothesis test for the value of the probability distribution function with different values of its argument. It is shown that each element of this sequence is unbiased locally by the most powerful test. This paper proposes an algorithm for calculating the significance level, free of probability distributions. The quality of this test is evaluated by numerical modeling.
About the authors
E. L. Kuleshov
Far Eastern Federal University
Author for correspondence.
Email: kuleshov.el@dvfu.ru
Russian Federation, ul. Sukhanov 8, Vladivostok, 690950
K. A. Petrov
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Russian Federation, ul. Sukhanov 8, Vladivostok, 690950
T. S. Kirillova
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Russian Federation, ul. Sukhanov 8, Vladivostok, 690950
R. A. Khaliullin
Far Eastern Federal University
Email: kuleshov.el@dvfu.ru
Russian Federation, ul. Sukhanov 8, Vladivostok, 690950
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