Raman studies of phase and atomic compositions of GeSi nanosystems after pulsed annealing


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Resumo

The phase and elemental compositions of GeSi heterostructures deposited on non-refractory substrates are analyzed by using a non-destructive express technique, i.e., the Raman spectroscopy. It is shown that application of pulsed laser annealing allows one to vary the elemental composition and size of nanocrystals formed from solid alloys of germanium and silicon.

Sobre autores

A. Dvurechenskii

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090; ul. Pirogova 2, Novosibirsk, 630090

V. Volodin

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Autor responsável pela correspondência
Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090; ul. Pirogova 2, Novosibirsk, 630090

G. Krivyakin

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

A. Shklyaev

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090; ul. Pirogova 2, Novosibirsk, 630090

S. Kochubei

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

I. Neizvestny

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: volodin@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

J. Stuchlik

Institute of Physics ASCR, Střešovice

Email: volodin@isp.nsc.ru
Tchéquia, Cukrovarnická 112/10, Praha 6, 16200

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