Generation of Boron Ions for Beam and Plasma Technologies
- Авторы: Bugaev A.S.1, Vizir A.V.1, Gushenets V.I.1, Nikolaev A.G.1, Oks E.M.1,2, Savkin K.P.1, Yushkov Y.G.2, Tyunkov A.V.2, Frolova V.P.1,2, Shandrikov M.V.1, Yushkov G.Y.1
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Учреждения:
- Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- Tomsk State University of Control Systems and Radioelectronics
- Выпуск: Том 62, № 7 (2019)
- Страницы: 1117-1122
- Раздел: Article
- URL: https://journals.rcsi.science/1064-8887/article/view/242025
- DOI: https://doi.org/10.1007/s11182-019-01825-6
- ID: 242025
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Аннотация
The urgency of the study of generation of beams and plasmas containing boron ions is caused by their application in ion-beam and plasma technologies of modification of the surface properties of not only semiconductors, but also structural materials. This is due to the fact that boron compounds are hard and chemically resistant materials that can be used to create hardening and protective surface coatings for a wide nomenclature of details. The operating principle and the characteristics of the experimental setup developed for generation of plasma and boron ion beams intended for creation of such coatings are presented, including an ion source based on vacuum arc with separation of boron isotopes in a magnetic field intended for highdose ion implantation, a plasma generator with boron target intended for obtaining coatings by magnetron sputtering, and a forevacuum electron source intended for synthesis of surface boron-containing coatings by electron beam evaporation.
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Об авторах
A. Bugaev
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Автор, ответственный за переписку.
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
A. Vizir
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
V. Gushenets
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
A. Nikolaev
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
E. Oks
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk; Tomsk
K. Savkin
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
Yu. Yushkov
Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
A. Tyunkov
Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
V. Frolova
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk; Tomsk
M. Shandrikov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
G. Yushkov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Россия, Tomsk
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