Generation of Boron Ions for Beam and Plasma Technologies
- Авторлар: Bugaev A.S.1, Vizir A.V.1, Gushenets V.I.1, Nikolaev A.G.1, Oks E.M.1,2, Savkin K.P.1, Yushkov Y.G.2, Tyunkov A.V.2, Frolova V.P.1,2, Shandrikov M.V.1, Yushkov G.Y.1
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Мекемелер:
- Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- Tomsk State University of Control Systems and Radioelectronics
- Шығарылым: Том 62, № 7 (2019)
- Беттер: 1117-1122
- Бөлім: Article
- URL: https://journals.rcsi.science/1064-8887/article/view/242025
- DOI: https://doi.org/10.1007/s11182-019-01825-6
- ID: 242025
Дәйексөз келтіру
Аннотация
The urgency of the study of generation of beams and plasmas containing boron ions is caused by their application in ion-beam and plasma technologies of modification of the surface properties of not only semiconductors, but also structural materials. This is due to the fact that boron compounds are hard and chemically resistant materials that can be used to create hardening and protective surface coatings for a wide nomenclature of details. The operating principle and the characteristics of the experimental setup developed for generation of plasma and boron ion beams intended for creation of such coatings are presented, including an ion source based on vacuum arc with separation of boron isotopes in a magnetic field intended for highdose ion implantation, a plasma generator with boron target intended for obtaining coatings by magnetron sputtering, and a forevacuum electron source intended for synthesis of surface boron-containing coatings by electron beam evaporation.
Негізгі сөздер
Авторлар туралы
A. Bugaev
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
A. Vizir
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
V. Gushenets
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
A. Nikolaev
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
E. Oks
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk; Tomsk
K. Savkin
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
Yu. Yushkov
Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
A. Tyunkov
Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
V. Frolova
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; Tomsk State University of Control Systems and Radioelectronics
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk; Tomsk
M. Shandrikov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
G. Yushkov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: bugaev@opee.hcei.tsc.ru
Ресей, Tomsk
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