On eikonal aberrations in axisymmetric double-reflector telescopic systems


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详细

A formula describing the eikonal distribution on the surface of the main reflector of a doublereflector system of a general form is derived and its expansion in powers of the offset of the source from the focus up to the fourth-order terms is obtained. The analysis and minimization of aberrations for a doublereflector aplanatic Schwarzschild system are performed.

作者简介

A. Venetskiy

Kotel’nikov Institute of Radio Engineering and Electronics

编辑信件的主要联系方式.
Email: AVenetsky@yandex.ru
俄罗斯联邦, ul. Mokhovaya 11 korp. 7, Moscow, 125009

V. Kaloshin

Kotel’nikov Institute of Radio Engineering and Electronics

Email: AVenetsky@yandex.ru
俄罗斯联邦, ul. Mokhovaya 11 korp. 7, Moscow, 125009


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