Enviar artigo por via de e-mail On eikonal aberrations in axisymmetric double-reflector telescopic systems
- Autores: Venetskiy A.1, Kaloshin V.1
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Afiliações:
- Kotel’nikov Institute of Radio Engineering and Electronics
- Edição: Volume 61, Nº 4 (2016)
- Páginas: 385-394
- Seção: Antenna and Feeder Systems
- URL: https://journals.rcsi.science/1064-2269/article/view/196900
- DOI: https://doi.org/10.1134/S1064226916040136
- ID: 196900
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Resumo
A formula describing the eikonal distribution on the surface of the main reflector of a doublereflector system of a general form is derived and its expansion in powers of the offset of the source from the focus up to the fourth-order terms is obtained. The analysis and minimization of aberrations for a doublereflector aplanatic Schwarzschild system are performed.
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Sobre autores
A. Venetskiy
Kotel’nikov Institute of Radio Engineering and Electronics
Autor responsável pela correspondência
Email: AVenetsky@yandex.ru
Rússia, ul. Mokhovaya 11 korp. 7, Moscow, 125009
V. Kaloshin
Kotel’nikov Institute of Radio Engineering and Electronics
Email: AVenetsky@yandex.ru
Rússia, ul. Mokhovaya 11 korp. 7, Moscow, 125009
