Metallographic Analysis during Multilayer Printed Circuit Board Production Quality Assurance with Interlayer Connections Composed of Radio-Electronic Systems
- 作者: Vorunichev D.S.1, Zasovin E.A.1
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隶属关系:
- MIREA—Russian Technological University
- 期: 卷 64, 编号 2 (2019)
- 页面: 182-185
- 栏目: Novel Radio Systems and Elements
- URL: https://journals.rcsi.science/1064-2269/article/view/200412
- DOI: https://doi.org/10.1134/S1064226919020207
- ID: 200412
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详细
The current state of the high-tech radio-electronic industry, including special and dual-purpose products, is considered. The main causes of space electronics failures are revealed. The estimation of modern manufacturing technical requirements for printed circuit boards is given as one of the main reasons for failure. The combined method of defect study and production quality assurance of multilayer printed circuit boards with interlayer connections composed of complex radio-electronic systems is proposed.
作者简介
D. Vorunichev
MIREA—Russian Technological University
编辑信件的主要联系方式.
Email: vorunichev@mirea.ru
俄罗斯联邦, Moscow, 119454
E. Zasovin
MIREA—Russian Technological University
Email: vorunichev@mirea.ru
俄罗斯联邦, Moscow, 119454
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