Specific features of the conductivity of chromium films with a thickness of several nanometers


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Specific features of the interaction of terahertz radiation with nanometer-thick chromium films deposited on quartz substrates are analyzed. Optical coefficients of chromium films with thicknesses ranging from 1.5 to 40 nm are measured in a frequency range of 0.25–1.1 THz. Pulsed spectroscopic measurements employ a picosecond oscillator. A maximum absorption coefficient of 43% is measured at a film thickness of 10 nm. Theoretical calculations of optical coefficients are performed with the aid of expressions that take into account a phenomenological dependence of conductivity on film thickness. It is demonstrated that the conductivity of thick chromium films (20–40 nm) is less than the conductivity of bulk metal by an order of magnitude.

作者简介

V. Andreev

Moscow State University

Email: vdv@cplire.ru
俄罗斯联邦, Moscow, 119991

A. Angeluts

Moscow State University

Email: vdv@cplire.ru
俄罗斯联邦, Moscow, 119991

V. Vdovin

Kotel’nikov Institute of Radio Engineering and Electronics

编辑信件的主要联系方式.
Email: vdv@cplire.ru
俄罗斯联邦, Mokhovaya ul. 11, str. 7, Moscow, 125009

V. Lukichev

Physicotechnological Institute

Email: vdv@cplire.ru
俄罗斯联邦, Nakhimovskii pr. 36/1, Moscow, 117218

A. Shkurinov

Moscow State University

Email: vdv@cplire.ru
俄罗斯联邦, Moscow, 119991

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