Specific features of the conductivity of chromium films with a thickness of several nanometers
- Autores: Andreev V.G.1, Angeluts A.A.1, Vdovin V.A.2, Lukichev V.F.3, Shkurinov A.P.1
-
Afiliações:
- Moscow State University
- Kotel’nikov Institute of Radio Engineering and Electronics
- Physicotechnological Institute
- Edição: Volume 61, Nº 1 (2016)
- Páginas: 61-65
- Seção: Nanoelectronics
- URL: https://journals.rcsi.science/1064-2269/article/view/196708
- DOI: https://doi.org/10.1134/S1064226915120025
- ID: 196708
Citar
Resumo
Specific features of the interaction of terahertz radiation with nanometer-thick chromium films deposited on quartz substrates are analyzed. Optical coefficients of chromium films with thicknesses ranging from 1.5 to 40 nm are measured in a frequency range of 0.25–1.1 THz. Pulsed spectroscopic measurements employ a picosecond oscillator. A maximum absorption coefficient of 43% is measured at a film thickness of 10 nm. Theoretical calculations of optical coefficients are performed with the aid of expressions that take into account a phenomenological dependence of conductivity on film thickness. It is demonstrated that the conductivity of thick chromium films (20–40 nm) is less than the conductivity of bulk metal by an order of magnitude.
Palavras-chave
Sobre autores
V. Andreev
Moscow State University
Email: vdv@cplire.ru
Rússia, Moscow, 119991
A. Angeluts
Moscow State University
Email: vdv@cplire.ru
Rússia, Moscow, 119991
V. Vdovin
Kotel’nikov Institute of Radio Engineering and Electronics
Autor responsável pela correspondência
Email: vdv@cplire.ru
Rússia, Mokhovaya ul. 11, str. 7, Moscow, 125009
V. Lukichev
Physicotechnological Institute
Email: vdv@cplire.ru
Rússia, Nakhimovskii pr. 36/1, Moscow, 117218
A. Shkurinov
Moscow State University
Email: vdv@cplire.ru
Rússia, Moscow, 119991
Arquivos suplementares
