Multiple Upsets Induced by Protons in 90-nm SRAMs
- Авторы: Ivanov N.1, Lobanov O.1, Pashuk V.1, Prygunov M.2, Sizova K.3
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Учреждения:
- Konstantinov Petersburg Nuclear Physics Institute
- LLC O2 Light Systems
- LLC NPC Granat
- Выпуск: Том 44, № 12 (2018)
- Страницы: 1205-1207
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/208165
- DOI: https://doi.org/10.1134/S1063785019010097
- ID: 208165
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Аннотация
The occurrence of single-event upsets (SEUs) in 90-nm SRAM integrated circuits irradiated by 1000-MeV protons has been investigated. The experimental data were analyzed and processed, and the results showed the possibility of multiple cell upsets in the integrated circuits studied.
Об авторах
N. Ivanov
Konstantinov Petersburg Nuclear Physics Institute
Email: ksizova@npcgranat.ru
Россия, Gatchina, Leningrad oblast, 188300
O. Lobanov
Konstantinov Petersburg Nuclear Physics Institute
Email: ksizova@npcgranat.ru
Россия, Gatchina, Leningrad oblast, 188300
V. Pashuk
Konstantinov Petersburg Nuclear Physics Institute
Email: ksizova@npcgranat.ru
Россия, Gatchina, Leningrad oblast, 188300
M. Prygunov
LLC O2 Light Systems
Email: ksizova@npcgranat.ru
Россия, St. Petersburg, 196084
K. Sizova
LLC NPC Granat
Автор, ответственный за переписку.
Email: ksizova@npcgranat.ru
Россия, St. Petersburg, 194021