Epitaxy of CdTe on sapphire substrates with titanium buffer layers


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The formation of a developed electrical relief on the sapphire substrate surface is investigated. A technique is proposed for introducing Ti4+ impurity atoms into the sapphire crystal lattice by depositing titanium layers with a thickness of about 5 nm and their annealing in air (oxidizing atmosphere) to a temperature of 1400°C. It is shown that this preliminary treatment of the sapphire substrate surface results in epitaxial growth of (111) СdTe films parallel to the sapphire (0001) plane at a temperature of 350°C.

作者简介

A. Muslimov

Shubnikov Institute of Crystallography, Federal Research Centre “Crystallography and Photonics”

编辑信件的主要联系方式.
Email: amuslimov@mail.ru
俄罗斯联邦, Moscow, 119333

A. Butashin

Shubnikov Institute of Crystallography, Federal Research Centre “Crystallography and Photonics”

Email: amuslimov@mail.ru
俄罗斯联邦, Moscow, 119333

V. Kanevsky

Shubnikov Institute of Crystallography, Federal Research Centre “Crystallography and Photonics”

Email: amuslimov@mail.ru
俄罗斯联邦, Moscow, 119333

V. Babaev

Dagestan State University

Email: amuslimov@mail.ru
俄罗斯联邦, Makhachkala, 367000

N. Alikhanov

Dagestan State University

Email: amuslimov@mail.ru
俄罗斯联邦, Makhachkala, 367000

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