Информация об авторе
Yanusova, L.
Выпуск | Раздел | Название | Файл |
Том 62, № 2 (2017) | Surface and Thin Films | Application of time–frequency wavelet analysis in the reflectometry of thin films | |
Том 63, № 5 (2018) | Surface and Thin Films | Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films | |
Том 64, № 1 (2019) | Surface and Thin Films | Synthesis of the Autocorrelation Function for Solving the Thin Film Reflectometry Inverse Problem |