Informaçao sobre o Autor
Yanusova, L.
Edição | Seção | Título | Arquivo |
Volume 62, Nº 2 (2017) | Surface and Thin Films | Application of time–frequency wavelet analysis in the reflectometry of thin films | |
Volume 63, Nº 5 (2018) | Surface and Thin Films | Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films | |
Volume 64, Nº 1 (2019) | Surface and Thin Films | Synthesis of the Autocorrelation Function for Solving the Thin Film Reflectometry Inverse Problem |