Enviar artigo por via de e-mail Low-voltage scanning electron microscopy of multilayer polymer systems
- Autores: Orekhov A.S.1,2, Klechkovskaya V.V.2, Kononova S.V.3
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Afiliações:
- National Research Centre “Kurchatov Institute”
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
- Institute of Macromolecular Compounds
- Edição: Volume 62, Nº 5 (2017)
- Páginas: 710-715
- Seção: Structure of Organic Compounds
- URL: https://journals.rcsi.science/1063-7745/article/view/191284
- DOI: https://doi.org/10.1134/S1063774517050145
- ID: 191284
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Resumo
The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.
Sobre autores
A. Orekhov
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
Email: klechvv@ns.crys.ras.ru
Rússia, Moscow, 123182; Moscow, 119333
V. Klechkovskaya
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
Autor responsável pela correspondência
Email: klechvv@ns.crys.ras.ru
Rússia, Moscow, 119333
S. Kononova
Institute of Macromolecular Compounds
Email: klechvv@ns.crys.ras.ru
Rússia, St. Petersburg, 199004
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