Low-voltage scanning electron microscopy of multilayer polymer systems


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Resumo

The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.

Sobre autores

A. Orekhov

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”

Email: klechvv@ns.crys.ras.ru
Rússia, Moscow, 123182; Moscow, 119333

V. Klechkovskaya

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”

Autor responsável pela correspondência
Email: klechvv@ns.crys.ras.ru
Rússia, Moscow, 119333

S. Kononova

Institute of Macromolecular Compounds

Email: klechvv@ns.crys.ras.ru
Rússia, St. Petersburg, 199004

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