Мақаланы E-mail арқылы жіберу Low-voltage scanning electron microscopy of multilayer polymer systems
- Авторлар: Orekhov A.S.1,2, Klechkovskaya V.V.2, Kononova S.V.3
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Мекемелер:
- National Research Centre “Kurchatov Institute”
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
- Institute of Macromolecular Compounds
- Шығарылым: Том 62, № 5 (2017)
- Беттер: 710-715
- Бөлім: Structure of Organic Compounds
- URL: https://journals.rcsi.science/1063-7745/article/view/191284
- DOI: https://doi.org/10.1134/S1063774517050145
- ID: 191284
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Аннотация
The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.
Авторлар туралы
A. Orekhov
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
Email: klechvv@ns.crys.ras.ru
Ресей, Moscow, 123182; Moscow, 119333
V. Klechkovskaya
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
Хат алмасуға жауапты Автор.
Email: klechvv@ns.crys.ras.ru
Ресей, Moscow, 119333
S. Kononova
Institute of Macromolecular Compounds
Email: klechvv@ns.crys.ras.ru
Ресей, St. Petersburg, 199004
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